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Jacob, Wolfgang, Keudell, Achim vom and Schwarz-Selinger, Thomas
Infrared analysis of thin films
:
amorphous, hydrogenated carbon on silicon
.
Braz. J. Phys.
, Mar 2001, vol.31, no.1, p.109-109. ISSN 0103-9733
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text in english
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Jacob, Wolfgang, Keudell, Achim von and Schwarz-Selinger, Thomas
Infrared analysis of thin films
:
amorphous, hydrogenated carbon on silicon
.
Braz. J. Phys.
, 2000, vol.30, no.3, p.508-516. ISSN 0103-9733
·
abstract in english
·
text in english
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