Eighteen durum wheat and two bread wheat genotypes were evaluated for grain yield, plant height, cycle from emergence to maturity, resistance to leaf spots caused by Helminthosporium sp, adaptability, stability and technological quality, in experiments, under sprinkler irrigation, carried out at different regions of State of São Paulo, Brazil. The bread wheat IAC 24 presented the highest yield but not differing from the durum genotypes ALTAR/STN (12), MEMOS"S"/YAV79/3/SAPIS"S"/TEAL"S"//HUI"S" (17), STN"S"/3/TEZ"S"/YAV79//HUI"S" (6), ALTAR/STN (11) and WIN"S"SBA81A//STIL"S"(14). At Ribeirão Preto site the grain yield mean of the evaluated genotypes was 5,332 kg/ha, in the period. Coefficients of determination for all genotypes were similar with exception for IAC 24 and IAC 1001. The last one, a durum wheat, showed instable in relation to grain yield under not favorable environments, and stable under favorable environments. The bread wheat IAC 24 presented opposite behaviour. The infection of the causal agent of leaf spot was low, but at Tatuí site the occurrence of this disease was more generalized. The best durum wheat genotypes in relation to quality were IAC 1003 (1), SCO"S"/3/BD1814//BD708/BD1543/4/ROK"S"(13), ALTAR 84 (15) and MEMOS"S"/YAV79/3/SAPI"S"/TEAL"S"/HUI"S" (17). The other durum wheat genotypes presented medium to low flour strength producing bad quality dough. Dough development time, sedimentation test, index of mixture tolerance, energy for deformation of the dough, falling number, tenacity versus elasticity (P/L) and dough stability were in order of importance the parameters to be considered combined with grain yield and adaptability for the genotype selections.
Triticum durum L.; T. aestivum L.; grain yield; diseases; adaptability, and technological quality
