Strontium Barium Niobate (SBN) thin films in the composition 75/25 (Sr0.75Ba0.25Nb2O 6) were deposited on Pt/Si substrates by a chemical method based in a polymeric resin obtained from different ion solutions. The films were crystallized in temperatures between 500 °C and 700 °C using a conventional furnace for 1 hour and using rapid thermal annealing (RTA) for 60 seconds. The ferroelectric phase SBN was confirmed for films crystallized in temperatures above 600 ºC, films thermal treated at 500 ºC we noted the presence of other phases such as SrNb2O6 and BaNb2O6, which are not ferroelectrics. The lattice parameters of the tetragonal SBN structure were calculated based in X-ray diffraction for different crystallization conditions and the values agree well with the values reported in literature for thin films obtained by other methods. The ferroelectrics parameters were obtained using a modified Sawyer-Tower circuit at 100 Hz frequency and room temperature. For films crystallized at 700 ºC the remanent polarization (Pr) and coercive field (Ec) values were 18 mC/cm² and 180 kV/cm for conventional thermal treatment and 17 mC/cm² e 235 kV/cm for rapid thermal annealing.
Thin films; ferroelectric; SBN; tungsten-bronze
