This research aimed to elaborate temporal NDVI profiles through the crop masks building, and find the interannual variations of profiles associated with variation of wheat grain yield in Rio Grande do Sul, Brazil. The data set were composed by MODIS13 images (NDVI product from May to November, 2000 to 2006), ground control points (collected in wheat, oat and barley fields) and official wheat grain yield (IBGE and Cotrijal). The results showed that using the proposed methodology for crop masking it is possible to generate consistent NDVI temporal profiles, which allows monitoring the development of winter cereal crops and can be used to evaluate the interannual variations of grain yield. The profiles showed that wheat grain yield was related to the maintenance of high NDVI values (above 0.7) for a larger period of time. However, the methodology did not allow the wheat, oats and barley discrimination, pointing for subsequent studies.
crops mask; wheat; oat; barley; MODIS sensor
