ABSTRACT:
This paper discusses how compiler optimizations influence software reliability when the optimized application is compiled with a technique to enable the software itself to detect and correct radiation-induced control-flow errors. Supported by a comprehensive fault-injection campaign using an established benchmark suite in the embedded systems domain, we show that the compiler is a non-negligible source of noise when hardening the software against radiation-induced soft errors.
KEYWORDS:
Compilers; Radiation effects; Single event upsets; Software reliability; Software engineering