Infrared analysis of thin films: amorphous, hydrogenated carbon on silicon

Erratum

Infrared analysis of thin films: amorphous, hydrogenated carbon on silicon

Wolfgang Jacob, Achim vom Keudell, and Thomas Schwarz-Selinger

Braz.J.Phys. 30, 508 (2000).

Unfortunately, some errors occurred in some equations during typesetting:

In Eqn.2, the last line describes the amplitude transmission coefficient for the perpendicular component, correspondingly, the subscript should read t_s instead of a second appearance of t_p. In addition, in the line following the equations the subscript r should read s. The complete equation system is

where the subscripts p and s denote the parallel (p) and perpendicular (s) components.

In Eqn. 7, the right hand side in the first line should end with dots (...) to indicate that it is an infinite series.

On page 511, in the displayed equation without equation number (between Eqns. l0 and 11) it should read 'and' instead of 'rmand' between the two expressions.

In Eqn. 13 there is one i missing in the phase factor e^-ib( 3^rd phase factor in the 3^rd addend of the right hand side of line 1)

In Eqn. 16 the subscript of N in the numerator of T₁₂₃ should read 3 instead of x. The correct Eqn. should read

In Eqn. 19, the plus sign between R₁₂₃ and the fraction is missing. The correct Eqn. should read

Publication Dates

• Publication in this collection
  21 Feb 2002
• Date of issue
  Mar 2001