Leaf area measurements are required in several agronomical studies. Usually, there is an interest for measurement methods that are simple, quick and that will not destroy the leaf. The objectives of this work were to evaluate leaf area (y), length (l) and width (w) of 20 half-sibling progenies of custard apple tree (Annona squamosa L.), and to fit regression equations of the type y = a + bx, where x = l.w, that will allow y to be estimated based on l and w. The experiment was conducted as random blocks with five replicates and four plants per plot. Five mature leaves were randomly collected from each plant. Leaf area was measured with an automatic measuring device and leaf dimensions were determined with a ruler. All values of b were different from zero. Differences occurred only in 11% of the 190 possible comparison pairs between progenies, with regard to the estimates of b. No differences were observed between progenies with respect to leaf length, width and area. In view of this fact, the equation y = 0.72 x (R² = 0.77) was fitted for all progenies.
Annona squamosa; sugar apple
