In accelerated lifetime testing (ALT) the assumption of stress-independent spread in life is commonly used and accepted because the resulting models are typically easier to use and data or past experience suggest that such a constrain is sometimes valid. However in many situations and with a variety of products the spread in life does depend on stress, i.e., the failure mechanism is not the same for all stress levels. In this paper the assessment of product time to failure at service conditions from ALT with stress-dependent spread is addressed by formulating a Bayesian framework where the time to failure follows a Weibull distribution, scale parameter dependency on stress is given by the Power Law, and two cases for the dependency between shape parameter and stress are discussed: linear relationship and, in order to allow a comparative analysis, stress-independent shape parameter. A previously published dataset is used to illustrate the procedure.
accelerated lifetime testing; Weibull distribution; Bayes’ theorem; reliability
