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Estudos de Psicologia (Natal)
versión impresa ISSN 1413-294X
GOMES, Cristiano Mauro Assis. Short term memory ability tests kit validity (CTMC). Estud. psicol. (Natal) [online]. 2011, vol.16, n.3, pp. 235-242. ISSN 1413-294X. http://dx.doi.org/10.1590/S1413-294X2011000300005.
This article is an exploratory study of CTMC validity. It investigates the CTMC factorial structure, and the convergent, divergent and predictive validity. Exploratory factor analysis was used to evaluate the factor structure of CTMC from 230 high school students' data. Structural equation modeling was used to evaluate the convergent, divergent and predictive validity. The result shows the reliability and validity of tests scores. The factorial structure of test items indicates three specialized factors of the short term memory (Gsm). Tests converge to measure Gsm while diverge to measure Gf. Gsm measured by CTMC predicts Gf.
Palabras clave : short term memory ability; validity; intelligence.