SciELO - Scientific Electronic Library Online

vol.7 issue2Thermal decomposition of illiteTemperature coefficient of piezoelectric constants in Pb(Mg1/3 Nb2/3)O3 - PbTiO3 ceramics author indexsubject indexarticles search
Home Pagealphabetic serial listing  

Materials Research

On-line version ISSN 1980-5373


BACICHETTI JUNIOR, Antonio Leondino et al. Influence of the crystallization thermal treatment on the structural and electrical properties of PZT thin films. Mat. Res. [online]. 2004, vol.7, n.2, pp. 363-367. ISSN 1980-5373.

Different methods have been proposed in the literature to deposit PZT thin films. Among these, chemical based processes have been revealed as a promising preparation route due to their low cost processing and the facility for controlling the stoichiometry of complex systems. The objective of this work was to investigate the influence of the time and temperature of crystallization on the physical properties of the Pb(Zr0.53Ti0.47)O3 thin films prepared by a hybrid method. The structural and microstructural dependence on the crystallization conditions of the PZT films were investigated by X-ray diffraction and atomic force microscopy. Dielectric and ferroelectric properties were also characterized and their behaviors were related to the structural evolution of films.

Keywords : Thin films; PZT; ferroelectrics; crystallization.

        · text in English     · English ( pdf epdf )


Creative Commons License All the contents of this journal, except where otherwise noted, is licensed under a Creative Commons Attribution License