This paper presents a sensitivity-based test generation tool for analog multifrequency testing and diagnosis. The test generation procedure is based on sensitivity analysis and on fault simulation. This tool generates minimal test sets that maximize the coverage of soft, large and hard component faults and that enhance the coverage of interconnect shorts. An introduction to the problem of analog fault diagnosis considering both component and interconnect faults, is also presented. This procedure is now being automated by integrating commercially available tools for symbolic computation and electrical simulation
Computer-Aided Testing; Automatic Test Generation; Analog and Mixed-signal Circuits
