The transmission, reflection, photoacoustic (PAS) and microscopy FT-IR techniques have been used for characterizing multilayer films. The ATR, microscopy FT-IR and PAS techniques showed better results, probably because it was possible to analyze only the sample surface by ATR, while with MIC/FT-IR each layer of the sample could be studied separately and in PAS the spectra could be obtained at different rates. A complete characterization for the films was achieved by combining with optical microscopy, DSC and FT-IR data.
Optical microscopy; DSC; FT-IR; ATR; DRIFT; PAS; multilayer films
