ABSTRACT:
This paper discusses how compiler optimizations influence software reliability when the optimized application is compiled with a technique to enable the software itself to detect and correct radiation-induced control-flow errors. Supported by a comprehensive fault-injection campaign using an established benchmark suite in the embedded systems domain, we show that the compiler is a non-negligible source of noise when hardening the software against radiation-induced soft errors.
KEYWORDS:
Compilers; Radiation effects; Single event upsets; Software reliability; Software engineering
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Publication Dates
-
Publication in this collection
Jul-Sep 2013
History
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Received
08 Jan 2013 -
Accepted
02 May 2013
