Abstract
Introduction
The implant-prosthetic abutment interface and the formation of its microgaps are relevant aspects in load transfer and biological response and are linked to the success of the rehabilitation.
Objective
To evaluate microgaps at the internal connection interface of the Cone Morse implant and the prosthetic component surface by means of scanning electron microscopy (SEM).
Material and method
Twenty 3.75 x 11.0 mm Cone Morse dental implants with their respective Singular® prosthetic abutments were used (Singular Implants, RN, Brazil). The straight trunnions were attached to the implants with a 32N/cm2 torque and the ES260 Epoxy Resin-based set emerged to allow longitudinal sectioning of the sample. The samples were analyzed and the microgaps measured in SEM (JEOL JCM-5700, MA, USA), and later the data were analyzed.
Result
The mean and standard deviation of the largest microgaps were observed in the apical part of the right and left side 1.44±2.68 and 1.16±1.49 μm, respectively. The smallest microgaps were on the upper implant right and left sides 0.60±0.73 and 0.66±0.67 μm, respectively. However, in the Kruskal-Wallis test there was no statistically significant difference between the implant regions, both for the left side (p=0.692) and right side (p=0.865). The Mann-Whitney test, there were no statistically significant differences between the sides for the different regions of the implants.
Conclusion
Even with the presence of microgaps in the implant-post interface, it presents a smaller size than the one presenting biological and mechanical problems. The samples analyzed for their fitting compatibility were satisfactory.
Descriptors:
Dental implants; dental abutments; scanning electron microscopy
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